SN74ABT18652PM Datablad

spesifikasjoner for SN74ABT18652PM

Delenummer : SN74ABT18652PM
Produsent : Texas Instruments
Beskrivelse : IC SCAN-TEST-DEV/TXRX 64-LQFP
Serie : 74ABT
Delstatus : Active
Logisk type : Scan Test Device With Transceivers And Registers
Forsyningsspenningen : 4.5V ~ 5.5V
Antall biter : 18
Driftstemperatur : -40°C ~ 85°C
Monteringstype : Surface Mount
Pakke / sak : 64-LQFP
Leverandørenhetspakke : 64-LQFP (10x10)
Vekt : -
Betingelse : Nytt og originalt
Kvalitets garanti : 365 dagers garanti
Stock Resource : Franchise distributør / produsent Direct
Opprinnelsesland : USA / TAIWAN / MEXICO / MALAYSIA / PHI
Produsentens varenummer
SN74ABT18652PM
Intern delenummer
AX-SN74ABT18652PM
Produsent
Texas Instruments
Kort beskrivelse
IC SCAN-TEST-DEV/TXRX 64-LQFP
RoHS Status
Blyfri / RoHS
Leveringstid
1-2 dager
tilgjengelig Antall
36589 Pieces
Reference Pris
USD 0
Vår pris
- (Ta kontakt med oss ​​for en bedre pris: [email protected])
AX Semiconductor har SN74ABT18652PM på lager for selger.
Frakt alternativer og shipping tid:
DHL: 2-3 days.
FEDEX: 2-3 days.
UPS: 2-4 days.
TNT: 3-5 days.
EMS: 5-8 days.
Normal Post: 10-15 days.
Betalingsalternativer:
Paypal (Credit Card)
Bank Transfer (Wire Transfer)
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