SN74BCT8374ADW Datablad

spesifikasjoner for SN74BCT8374ADW

Delenummer : SN74BCT8374ADW
Produsent : Texas Instruments
Beskrivelse : IC SCAN TEST DEVICE W/FF 24-SOIC
Serie : 74BCT
Delstatus : Active
Logisk type : Scan Test Device with D-Type Edge-Triggered Flip-Flops
Forsyningsspenningen : 4.5V ~ 5.5V
Antall biter : 8
Driftstemperatur : 0°C ~ 70°C
Monteringstype : Surface Mount
Pakke / sak : 24-SOIC (0.295", 7.50mm Width)
Leverandørenhetspakke : 24-SOIC
Vekt : -
Betingelse : Nytt og originalt
Kvalitets garanti : 365 dagers garanti
Stock Resource : Franchise distributør / produsent Direct
Opprinnelsesland : USA / TAIWAN / MEXICO / MALAYSIA / PHI
Produsentens varenummer
SN74BCT8374ADW
Intern delenummer
AX-SN74BCT8374ADW
Produsent
Texas Instruments
Kort beskrivelse
IC SCAN TEST DEVICE W/FF 24-SOIC
RoHS Status
Blyfri / RoHS
Leveringstid
1-2 dager
tilgjengelig Antall
58188 Pieces
Reference Pris
USD 0
Vår pris
- (Ta kontakt med oss ​​for en bedre pris: [email protected])
AX Semiconductor har SN74BCT8374ADW på lager for selger.
Frakt alternativer og shipping tid:
DHL: 2-3 days.
FEDEX: 2-3 days.
UPS: 2-4 days.
TNT: 3-5 days.
EMS: 5-8 days.
Normal Post: 10-15 days.
Betalingsalternativer:
Paypal (Credit Card)
Bank Transfer (Wire Transfer)
Western Union
MoneyGram

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